Publications

Giovanni SPAGNUOLO Publications


1998
Contributo in Atti di convegno
Catch The True Worst-case In Tolerance And Sensitivity Analysis By Genetic Algorithms And Affine Mathematics.
In: Proceedings of 1998 IEEE 6th International Conference on Optimization of Electrical and Electronic Equipments (OPTIM) New York IEEE Vol.2, Pag.583-588
ISBN:9739851126
1998 IEEE 6th International Conference on Optimization of Electrical and Electronic Equipments (OPTIM)
Brasov, Romania 14-15 May 1998
Egiziano, Luigi; Femia, Nicola; Spagnuolo, Giovanni; Vocca, Gaetano
Versione online
Digital Object Identifier (DOI): 10.1109/OPTIM.1998.707999
Codice identificativo SCOPUS: 2-s2.0-85044520940
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1998
Contributo in Atti di convegno
A Layered Software Architecture with Uncertainty Handling Capabilities for Circuit Computer-Aided Design.
In: Proceedings of 1998 International Conference on Optimization of Electrical and Electronic Equipment (OPTIM1998) New York IEEE Vol.2, Pag.577-582
ISBN:9739851126
International Conference on Optimization of Electrical and Electronic Equipment
Brasov, Romania 14-15 May 1998
Arcelli Fontana, Francesca; DE SANTO, Massimo; Femia, Nicola; Spagnuolo, Giovanni; Vocca, Giovanni
Versione online
Digital Object Identifier (DOI): 10.1109/OPTIM.1998.707998
Codice identificativo SCOPUS: 2-s2.0-6644225614
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1998
Contributo in Atti di convegno
NEW APPROACHES TO THE TRUE-WORST-CASE EVALUATION IN CIRCUIT TOLERANCE & SENSITIVITY ANALYSIS: PART II - CALCULATION OF THE OUTER SOLUTION USING AFFINE ARITHMETIC. Pag.141-148
6th IEEE Workshop on Computers in Power Electronics
Egiziano, Luigi; N., Femia; Spagnuolo, Giovanni
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1998
Contributo in Atti di convegno
New Approaches to the True-Worst-Case Evaluation in Circuit Tolerance Analysis: Part I - Calculation of the Inner Solution Using Genetic Algorithms.
In: Proceedings of 1998 IEEE Workshop on Computers in Power Electronics (WCPE1998) IEEE Vol.1, Pag.133-139
ISBN:0780348567
1998 IEEE Workshop on Computers in Power Electronics
Cernobbio, Italy 19 - 22 Jul 1998
Egiziano, Luigi; Femia, Nicola; Spagnuolo, Giovanni
Digital Object Identifier (DOI): 10.1109/CIPE.1998.779670
Codice identificativo ISI: WOS:000081434700023
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1998
Contributo in Atti di convegno
True-worst-case evaluation in circuit tolerance and sensitivity analysis using genetic algorithms and affine mathematics.
In: Proceedings of 1998 IEEE International Symposium on Circuits and Systems (ISCAS1998) IEEE Vol.6, Pag.458-461
ISBN:0-7803-4455-3
1998 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS ’98)
MONTEREY, CALIFORNIA, U.S.A. 31 May-3 Jun 1998
Egiziano, L.; Femia, N.; Spagnuolo, G.; Vocca, G.
Versione online
Digital Object Identifier (DOI): 10.1109/ISCAS.1998.705310
Codice identificativo ISI: WOS:000075224600842
Codice identificativo SCOPUS: 2-s2.0-0031622765
Show it in Product Database (IRIS)
1998
Contributo in Atti di convegno
New Approaches to the True-Worst-Case Evaluation in Circuit Tolerance Analysis: Part II - Calculation of the Outer Solution Using Affine Arithmetic.
In: Proceedings of 1998 IEEE Workshop on Computers in Power Electronics (WCPE1998) IEEE Vol.1, Pag.141-147
ISBN:0780348567
1998 IEEE Workshop on Computers in Power Electronics
Cernobbio, Italy 19 - 22 Jul 1998
Egiziano, Luigi; Femia, Nicola; Spagnuolo, Giovanni
Digital Object Identifier (DOI): 10.1109/CIPE.1998.779671
Codice identificativo ISI: WOS:000081434700024
Show it in Product Database (IRIS)