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TECHNOLOGIES FOR THE ANALYSIS OF NANOMATERIALS

Antonio DI BARTOLOMEO TECHNOLOGIES FOR THE ANALYSIS OF NANOMATERIALS

0512900021
DEPARTMENT OF PHYSICS "E. R. CAIANIELLO"
EQF6
SCIENCE AND NANOTECHNOLOGY FOR SUSTAINABILITY
2024/2025

OBBLIGATORIO
YEAR OF COURSE 3
YEAR OF DIDACTIC SYSTEM 2022
SPRING SEMESTER
CFUHOURSACTIVITY
648LESSONS
ANTONIO DI BARTOLOMEO T Curriculum
MASSIMILIANO POLICHETTI Curriculum
Objectives
GENERAL OBJECTIVE:
THE COURSE AIMS TO PROVIDE STUDENTS WITH THE KNOWLEDGE AND BASIC PRINCIPLES REGARDING THE MAIN TECHNIQUES OF ANALYSIS OF NANOMATERIALS, AND TO TRAIN THE STUDENT IN THE STUDY OF THE MORPHOLOGICAL, STRUCTURAL, COMPOSITIONAL, ELECTRICAL AND MAGNETIC CHARACTERISTICS OF NANOSTRUCTURED MATERIALS THROUGH THE KNOWLEDGE OF ADVANCED IMAGING TECHNIQUES AND EQUIPMENT, ANALYTICAL CHARACTERIZATION AND ANALYSIS OF PHYSICAL PROPERTIES

KNOWLEDGE AND ABILITY TO UNDERSTAND:
AT THE END OF THE COURSE THE MAIN KNOWLEDGE ACQUIRED WILL BE:
- OPTICAL, ELECTRONIC, ION SCATTERING AND X-RAY SPECTROSCOPY TECHNIQUES
- TECHNIQUES AND EQUIPMENT FOR ELECTRONIC AND SCANNING PROBE MICROSCOPY
- TECHNIQUES AND EQUIPMENT FOR MEASURING THE ELECTRICAL AND OPTOELECTRONIC PROPERTIES OF NANOMATERIALS
- TECHNIQUES FOR CONTROLLED TEMPERATURE AND PRESSURE MEASUREMENTS
-THE DESCRIPTION AND TREATMENT OF THE MAGNETIC BEHAVIOR OF MATERIALS WITH PARTICULAR REGARD TO NANOMETRIC SAMPLES: PARAMAGNETISM, FERROMAGNETISM, DIAMAGNETISM, SUPERPARAMAGNETISM, FERRIMAGNETISM, ANTIFERROMAGNETISM.
- TECHNIQUES AND EQUIPMENT FOR MEASURING MAGNETIC PROPERTIES IN THE DC FIELD – THE VIBRATING SAMPLE MAGNETOMETER – THE EXTRACTION TECHNIQUE – KERR EFFECT MAGNETOMETRY – NOTES ON THE SQUID MAGNETOMETER
- TECHNIQUES AND EQUIPMENT FOR MEASUREMENT OF MAGNETIC SUSCEPTIBILITY IN ALTERNATE FIELD AND ANALYSIS OF THE BEHAVIORS AS FUNCTION OF THE EXTERNAL MEASUREMENT PARAMETERS
- THE PROPERTIES OF NANO-STRUCTURED SUPERCONDUCTING MATERIALS - NANOMETRIC DEFECTS IN SUPERCONDUCTORS AND THEIR EFFECT - MEASUREMENT TECHNIQUES OF CHARACTERISTIC AND USEFUL QUANTITIES FOR APPLICATIONS.

ABILITY TO APPLY KNOWLEDGE AND UNDERSTANDING:
THE COURSE AIMS TO PROVIDE THE STUDENT WITH THE ABILITY TO DEVELOP SKILLS IN IDENTIFYING THE ANALYSIS TECHNIQUE SUITABLE FOR THE PROPERTY TO BE MEASURED, AND IN THE EXTRACTION OF INFORMATION ON THE CHARACTERISTICS OF NANOMATERIALS RELATED TO THEIR MACROSCOPIC BEHAVIOR, ALSO THROUGH THE DIRECT PROCESSING OF SOME EXPERIMENTAL DATA SETS OBTAINED ON NANOSTRUCTURED SAMPLES

INDEPENDENCE OF JUDGMENT:
IT IS INTENDED TO ENCOURAGE, THROUGH QUESTIONS AND DISCUSSIONS, THE CRITICAL LEARNING OF THE COURSE TOPICS, WITH THE AIM OF ALLOWING THE ACHIEVEMENT, AT THE END OF THE COURSE, OF A GOOD LEVEL OF AUTONOMY REGARDING THE ANALYSIS OF BOTH PRACTICAL AND THEORETICAL SITUATIONS.

COMMUNICATION SKILLS:
THE COURSE AIMS TO PROVIDE STUDENTS WITH THE PROPERTY OF SCIENTIFIC LANGUAGE, THE BASIC TECHNICAL KNOWLEDGE AND THE REASONING NECESSARY TO EXPOSE AND COMMUNICATE THE ACQUIRED KNOWLEDGE IN A CRITICAL AND SCIENTIFICALLY RIGOROUS MANNER.

LEARNING ABILITY:
AT THE END OF THE COURSE THE STUDENT WILL HAVE:
- LEARNED HOW TO DEAL WITH THE ANALYSIS OF DIFFERENT PROPERTIES OF NANOMATERIALS;
- ACQUIRED AN UNDERSTANDING OF THE MAIN TECHNICAL CHARACTERISTICS, SENSITIVITY, FUNDAMENTAL PARAMETERS AND THE POSSIBILITIES OFFERED BY THE VARIOUS ANALYSIS TECHNIQUES COVERED;
- GAINED THE ABILITY TO USE DIFFERENT MEASUREMENT TOOLS.
Prerequisites
COURSE PREREQUISITES: ALGEBRA, VECTORS, ELEMENTARY FUNCTIONS, DERIVATIVES AND INTEGRALS . IT IS ALSO APPROPRIATE FOR THE STUDENT TO HAVE SUCCESSFULLY PASSED AT LEAST THE BASIC CHEMISTRY AND PHYSICS EXAMS AND TO HAVE A SOLID KNOWLEDGE OF THE CONCEPTS RELATING TO KINEMATICS, FORCE, MOMENTUM, WORK, ENERGY, POTENTIAL, ELECTRIC CURRENT, ELECTRIC FIELD AND MAGNETIC FIELD .
Contents
NANOMATERIALS CHARACTERIZATION TECHNIQUES
LECTURES AND LABORATORY (48 H)

1 PHYSICAL AND CHEMICAL CHARACTERIZATION OF NANOMATERIALS (2H)
PARTICLE MORPHOLOGY AND SIZE, LOCAL STRUCTURE, CRYSTAL STRUCTURE, MICROSTRUCTURE, MORPHOLOGICAL FEATURES, STRUCTURAL DEFECTS, OPTICAL STUDIES, STRUCTURAL ANALYSIS, ELEMENTAL STUDIES, SIZE ESTIMATION, PHYSICOCHEMICAL CHARACTERISTICS, MAGNETIC PROPERTIES IN AC AND IN DC FIELD
2. OPTICAL SPECTROSCOPY (2H)
OPTICAL ABSORPTION SPECTROSCOPY (OAS), PHOTOLUMINESCENCE (PL), FOURIER TRANSFORM INFRARED SPECTROSCOPY (FTIR), RAMAN SPECTROSCOPY
3. ELECTRON SPECTROSCOPY (2H)
ENERGY DISPERSIVE X-RAY SPECTROSCOPY (EDS), X-RAY PHOTOELECTRON SPECTROSCOPY (XPS), AUGER ELECTRON SPECTROSCOPY (AES), ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY (UPS)
4. IONIC SCATTERING SPECTROSCOPY (2H)
ION SCATTERING SPECTROSCOPY, BASIC IONS IN ION SCATTERING SPECTROSCOPY, MASS RESOLUTION BY ION SCATTERING SPECTROSCOPY, RUTHERFORD BACKSCATTERING SPECTROMETRY (RBS), SECONDARY ION MASS SPECTROMETRY (SIMS)
5. X-RAY TECHNIQUES (2H)
X-RAY DIFFRACTION TECHNIQUE (XRD), SMALL-ANGLE X-RAY SCATTERING (SAXS, X-RAY ABSORPTION SPECTROSCOPY (XAS)
6. ELECTRON MICROSCOPY (2H)
SCANNING ELECTRON MICROSCOPY (SEM), TRANSMISSION ELECTRON MICROSCOPY (TEM)/HIGH RESOLUTION (HR-TEM) WITH SELECTED AREA ELECTRON DIFFRACTION (SAED), ENVIRONMENTAL TRANSMISSION ELECTRON MICROSCOPY (ETEM)
7. SCANNING PROBE MICROSCOPY (SPM) (2H)
SCANNING TUNNEL MICROSCOPY (STM), ATOMIC FORCE MICROSCOPY (AFM), KELVIN PROBE FORCE MICROSCOPY (KPFM)
8. ELECTRICAL CHARACTERIZATION TECHNIQUES (10H):
8.1 RESISTIVITY (3H)
RESISTIVITY AS A FUNCTION OF DOPING DENSITY, INTRINSIC CARRIER DENSITY, TWO-POINT VERSUS FOUR-POINT PROBE, CORRECTION FACTORS, RESISTIVITY OF ARBITRARILY SHAPED SAMPLES, MEASUREMENT CIRCUITS
8.2 CARRIER AND DOPING DENSITY (3H)
CAPACITANCE-VOLTAGE (C-V), DIFFERENTIAL CAPACITANCE, BAND OFFSETS, ELECTROCHEMICAL C–V PROFILER (ECV), CURRENT-VOLTAGE (I-V), SPREADING RESISTANCE, SERIES RESISTANCE, MINORITY CARRIERS AND INTERFACE TRAPS, HALL EFFECT, OPTICAL TECHNIQUES
8.3 CONTACT RESISTANCE AND SCHOTTKY BARRIERS (4H)
METAL-SEMICONDUCTOR CONTACTS, CONTACT RESISTANCE, MEASUREMENT TECHNIQUES, TWO-CONTACT TWO-TERMINAL METHOD, MULTIPLE-CONTACT TWO-TERMINAL METHODS, NON-PLANAR CONTACTS, SCHOTTKY BARRIER HEIGHT, CURRENT-VOLTAGE, CURRENT—TEMPERATURE, CAPACITANCE-VOLTAGE, PHOTOCURRENT

9 DESCRIPTION OF THE MAGNETIC PROPERTIES OF MATERIALS (3H)
PARAMAGNETISM, FERROMAGNETISM, SUPERPARAMAGNETISM, DIAMAGNETISM, FERRIMAGNETISM. ANTIFERROMAGNETISM –THE MAGNETIC HYSTERESIS LOOP, THE REMANENT MAGNETIZATION, THE COERCIVITY – THE MAGNETIC DOMAINS

10 THE TECHNIQUES AND THE EQUIPMENTS FOR THE MEASUREMENT OF DC MAGNETIC PROPERTIES (1.5H)
THE HALL SENSOR - THE VIBRATING SAMPLE MAGNETOMETER – THE EXTRACTION TECHNIQUE – KERR MAGNETOMETRY – THE SQUID MAGNETOMETRY (OUTLINE)

11 THE TECHNIQUES AND THE EQUIPMENTS FOR THE MEASUREMENT OF AC MAGNETIC PROPERTIES (1.5H)
THE COMPLEX AC MAGNETIC SUSCEPTIBILITY – THE AC SUSCEPTOMETRY – SINGLE PICK-UP COIL SUSCEPTOMETER – DOUBLE PICK-UP COILS SUSCEPTOMETER

12 THE PROPERTIES OF SUPERCONDUCTING MATERIALS (2H)
ELECTRICAL AND MAGNETIC PROPERTIES OF SUPERCONDUCTING MATERIALS – SUPERCONDUCTING THIN FILMS – NANOMETRIC DEFECTS IN SUPERCONDUCTORS AND THEIR EFFECT ON THE SUPERCONDUCTING PROPERTIES – MEASUREMENT TECHNIQUES OF THE PROPERTIES USEFUL FOR THE APPLICATIONS

13. ON-THE-JOB MAGNETIC CHARACTERIZATION TECHNIQUES (16H):
DC MAGNETIZATION MEASUREMENT OF MAGNETIC NANOPARTICLES AS FUNCTION OF THE TEMPERATURE AND OF THE MAGNETIC FIELD – ANALYSIS OF THE AC SUSCEPTIBILITY OF MAGNETIC NANOPARTICLES – MAGNETO OPTICAL KERR EFFECT MEASUREMENTS OF A FILM OF MAGNETIC NANOPARTICLES EMBEDDED IN A MATRIX - DATA ANALYSIS AND EXTRACTION OF THE MATERIALS PROPERTIES FROM THE EXPERIMENTAL CURVES
Teaching Methods
THE COURSE INCLUDES 48 HOURS OF TEACHING IN CLASSROOM LESSONS AND IN RESEARCH LABORATORIES WHERE EQUIPMENT FOR THE ANALYSIS OF NANOMATERIALS OPERATES. ATTENDANCE IS NOT MANDATORY BUT IS STRONGLY RECOMMENDED. ALL THE MOST RELEVANT AND NECESSARY CALCULATIONS TO EXPOSE THE CONCEPTS AND TECHNIQUES ARE CARRIED OUT AND CLARIFIED DURING EACH LESSON.
Verification of learning
THE ACHIEVEMENT OF THE TEACHING OBJECTIVES IS CERTIFIED BY PASSING AN ORAL EXAM, WITH A GRADE EXPRESSED OUT OF THIRTY. THE ORAL TEST WILL CONSIST OF THE EXPOSITION, IN THE FORM OF A SEMINAR APPROXIMATELY 20 MINUTES LONG, OF A TECHNIQUE FOR THE ANALYSIS OF NANOMATERIALS CHOSEN AT LEISURE BY THE STUDENT, AND IN QUESTIONS POSED BY THE EXAMINATION BOARD ON THE TOPICS OF THE PROGRAM CARRIED OUT. A SUFFICIENTLY CORRECT AND ADEQUATELY DETAILED EXPOSURE OF THE SELECTED TECHNIQUE GUARANTEES PASSING THE EXAM WITH A MINIMUM GRADE OF 18, WHILE AN EXCELLENT AND IN-DEPTH EXPOSURE ALLOWS THE STUDENT TO ACHIEVE A MAXIMUM GRADE OF 24. THE ANSWERS TO THE FOLLOWING QUESTIONS ON THE COURSE SYLLABUS WILL ALLOW THE STUDENT TO ACHIEVE A MARK OF 30. PRAISE WILL BE AWARDED TO STUDENTS WHO SHOW MASTERY IN THE DISCUSSION OF THE EXPOSED ANALYSIS TECHNIQUE, EXCELLENT SCIENTIFIC LANGUAGE ABILITY, WEALTH OF THE EXPOSED CONTENTS AND CORRECT AND DETAILED ANSWERS TO THE QUESTIONS RECEIVED FROM THE EXAMINATION BOARD.
THE EXAM IS AIMED AT ASSESSING THE LEVEL OF KNOWLEDGE, ABILITY TO UNDERSTAND AND LEVEL OF IN-DEPTH REACHED BY THE STUDENT, AND TO VERIFY THE ABILITY TO EXPOSE CONCEPTS WITH THE USE OF APPROPRIATE TERMINOLOGY.
Texts
RECOMMENDED READINGS
BOOKS:
- E. O. ORTEGA ET AL., “MATERIAL CHARACTERIZATION TECHNIQUES AND APPLICATIONS”, SPRINGER 2022
- I. MUNAWEERA, M.L. C. MADHUSHA, “CHARACTERIZATION TECHNIQUES FOR NANOMATERIALS”, CRC PRESS 2023
- DIETER K. SCHRODER, “SEMICONDUCTOR MATERIAL AND DEVICE CHARACTERIZATION”, THIRD EDITION JOHN WILEY & SONS, INC., 2006

TEACHING MATERIAL:
SLIDES OF THE LECTURES

FOR FURTHER INFORMATION:
“MAGNETIC PROPERTIES OF NANOPARTICLES” BY S. MORUP, C. FRANDSEN E M.F. HANSEN
“MAGNETISM IN CONDENSED MATTER” DI S. BLUNDELL – OXFORD MASTER SERIES IN CONDENSED MATTER PHYSICS
“A.C. SUSCEPTIBILITY AS A PROBE OF LOW-FREQUENCY MAGNETIC DYNAMICS” DI C.V TOPPING E S.J BLUNDELL - J. PHYS.: CONDENS. MATTER 31 013001 (2019)
More Information
LANGUAGE OF THE LECTURES: ITALIAN OR ENGLISH
FURTHER INFORMATION CAN BE REQUESTED VIA E-MAIL TO:
ADIBARTOLOMEO@UNISA.IT (PROF. ANTONIO DI BARTOLOMEO)
MPOLICHETTI@UNISA.IT (PROF. MASSIMILIANO POLICHETTI)
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