Pubblicazioni

Gian Domenico LICCIARDO Pubblicazioni


2023
Contributo in Atti di convegno
Tiny compensation of pressure drift measurements due to long exposures to high temperatures.
In: Conference Record - IEEE Instrumentation and Measurement Technology Conference 345 E 47TH ST, NEW YORK, NY 10017 USA Institute of Electrical and Electronics Engineers Inc. Vol.2023-, Pag.01-05
ISBN:978-1-6654-5383-7
2023 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2023
Kuala Lumpur Convention Centre, Jalan Pinang, Kuala Lumpur City Centre, mys 2023
Vitolo, P.; Pau, D.; Licciardo, G. D.; Pesaturo, M.; Bosco, S.; Pennino, S.
Digital Object Identifier (DOI): 10.1109/I2MTC53148.2023.10175998
Codice identificativo ISI: WOS:001039259600117
Codice identificativo SCOPUS: 2-s2.0-85166369609
Visualizza sul Database dei Prodotti (IRIS)
2023
Contributo in Atti di convegno
A DC SPICE Level 3 Model for 4H-SiC lateral NMOSFET under strong inversion conditions.
In: PRIME 2023 - 18th International Conference on Ph.D Research in Microelectronics and Electronics, Proceedings 345 E 47TH ST, NEW YORK, NY 10017 USA Institute of Electrical and Electronics Engineers Inc. Pag.233-236
ISBN:979-8-3503-0320-9
18th International Conference on Ph.D Research in Microelectronics and Electronics, PRIME 2023
City of Arts and Sciences and the Turia Gardens, esp 2023
Rinaldi, N.; Licciardo, G. D.; Di Benedetto, L.; Rommel, M.; Erlbacher, T.
Digital Object Identifier (DOI): 10.1109/PRIME58259.2023.10161965
Codice identificativo ISI: WOS:001018707400059
Codice identificativo SCOPUS: 2-s2.0-85165110713
Visualizza sul Database dei Prodotti (IRIS)
2023
Contributo in Atti di convegno
FPGA HardWare Architecture for SVPWM Based on a Taylor Series Decomposition.
In: Lecture Notes in Electrical Engineering Springer Science and Business Media Deutschland GmbH Vol.1005, Pag.218-224
ISBN:978-3-031-26065-0; 978-3-031-26066-7
53rd Annual Meeting of the Italian Electronics Society, SIE 2022
ita 2022
Donisi, A.; Di Benedetto, L.; Liguori, R.; Licciardo, G. D.; Rubino, A.
Digital Object Identifier (DOI): 10.1007/978-3-031-26066-7_34
Codice identificativo SCOPUS: 2-s2.0-85149974037
Visualizza sul Database dei Prodotti (IRIS)
2023
Contributo in Atti di convegno
In-sensor neural network for real-time KWS by image processing.
In: Proceedings of SPIE - The International Society for Optical Engineering SPIE Vol.12571, Pag.1-4
Real-time Processing of Image, Depth and Video Information 2023
Praga 2023
Vitolo, P.; Esposito, P.; Pau, D.; Liguori, R.; Di Benedetto, L.; Licciardo, G. D.
Digital Object Identifier (DOI): 10.1117/12.2665545
Codice identificativo SCOPUS: 2-s2.0-85171198360
Visualizza sul Database dei Prodotti (IRIS)
2023
Contributo in Atti di convegno
Monitoring Hardware True Random Number Generators with Artificial Neural Networks: Problem Modeling and Training Dataset Generation.
In: Lecture Notes in Electrical Engineering Springer Nature Vol.1110 LNEE, Pag.291-296
ISBN:9783031481208; 9783031481215
International Conference on Applications in Electronics Pervading Industry, Environment and Society, APPLEPIES 2023
Genova 28-29 settembre 2023
Addabbo, T.; Licciardo, G. D.; Moretti, R.; Rubino, A.; Spinelli, F.; Vignoli, V.; Vitolo, P.
Digital Object Identifier (DOI): 10.1007/978-3-031-48121-5_41
Codice identificativo SCOPUS: 2-s2.0-85184095380
Visualizza sul Database dei Prodotti (IRIS)
2023
Contributo in Atti di convegno
Low-power CNN for Real-time Driver Posture Monitoring by Image Processing.
In: Proceedings of SPIE - The International Society for Optical Engineering SPIE Vol.12571, Pag.1-4
Real-time Processing of Image, Depth and Video Information 2023
Praga 2023
Licciardo, G. D.; Vitolo, P.; Liguori, R.; Di Benedetto, L.; Donisi, A.; Cappetti, N.; Naddeo, A.
Digital Object Identifier (DOI): 10.1117/12.2665613
Codice identificativo SCOPUS: 2-s2.0-85171167625
Visualizza sul Database dei Prodotti (IRIS)
2023
Contributo in Atti di convegno
Low-complexity Machine Learning Architecture for Hardware-aware True Random Number Generators Assessment and Continuous Monitoring.
In: PRIME 2023 - 18th International Conference on Ph.D Research in Microelectronics and Electronics, Proceedings 345 E 47TH ST, NEW YORK, NY 10017 USA Institute of Electrical and Electronics Engineers Inc. Pag.221-224
ISBN:979-8-3503-0320-9
18th International Conference on Ph.D Research in Microelectronics and Electronics, PRIME 2023
City of Arts and Sciences and the Turia Gardens, esp 2023
Spinelli, F.; Moretti, R.; Addabbo, T.; Vitolo, P.; Licciardo, G. D.
Digital Object Identifier (DOI): 10.1109/PRIME58259.2023.10161903
Codice identificativo ISI: WOS:001018707400056
Codice identificativo SCOPUS: 2-s2.0-85165097882
Visualizza sul Database dei Prodotti (IRIS)