Alfredo RUBINO | Publications
Alfredo RUBINO Publications
| 2007 | |
| Articolo in rivista | |
| The Relation between the Electrical, Chemical, and Morphological Properties of Indium-Tin Oxide Layers and Double-Layer Light-Emitting Diode Performance JOURNAL OF PHYSICAL CHEMISTRY. C. Vol. 111. Pag.17404-17408 ISSN:1932-7447. | |
| Vacca, P; Petrosino, Mario; Guerra, A; Chierchia, R; Minarini, C; DELLA SALA, D; Rubino, Alfredo | |
| Codice identificativo ISI: WOS:000251024500036 Codice identificativo SCOPUS: 2-s2.0-37149054904 | |
| Show it in Product Database (IRIS) |
| 2007 | |
| Articolo in rivista | |
| Electrical transport properties characterization of PVK (poly N-vinylcarbazole) for electroluminescent devices applications SOLID-STATE ELECTRONICS. Vol. 51. Pag.101-107 ISSN:0038-1101. | |
| P., Dangelo; M., Barra; A., Cassinese; M. G., Maglione; P., Vacca; C., Minarini; Rubino, Alfredo | |
| Versione online | |
| Digital Object Identifier (DOI): 10.1016/j.sse.2006.11.008 Codice identificativo ISI: WOS:000247900700017 Codice identificativo SCOPUS: 2-s2.0-33846655372 | |
| Show it in Product Database (IRIS) |
| 2007 | |
| Articolo in rivista | |
| Influence of Electrical, Chemical and Morphological Properties of Inorganic/Organic Interface on Light Emitting Devices Performance MACROMOLECULAR SYMPOSIA. Vol. 247. Pag.333-339 ISSN:1022-1360. | |
| Vacca, P; Petrosino, Mario; Chierchia, R; Guerra, A; Minarini, C; Rubino, Alfredo | |
| Codice identificativo ISI: WOS:000245288600039 Codice identificativo SCOPUS: 2-s2.0-34547177187 | |
| Show it in Product Database (IRIS) |
| 2007 | |
| Articolo in rivista | |
| AN ANALYTICAL MODEL OF AN OCVD-BASED MEASUREMENT TECHNIQUE OFTHE LOCAL CARRIER LIFETIME IEEE TRANSACTIONS ON ELECTRON DEVICES. Vol. 54. Pag.2998-3006 ISSN:0018-9383. | |
| Bellone, Salvatore; Licciardo, GIAN DOMENICO; Guerriero, G; Rubino, Alfredo | |
| Codice identificativo ISI: WOS:000250590200024 Codice identificativo SCOPUS: 2-s2.0-36248941262 | |
| Show it in Product Database (IRIS) |
| 2007 | |
| Articolo in rivista | |
| Electrical Stress Degradation of Small-Grain PolysiliconThin-Film Transistors IEEE TRANSACTIONS ON ELECTRON DEVICES. Vol. 54. Pag.476-482 ISSN:0018-9383. | |
| D., Palumbo; S., Masala; P., Tassini; Rubino, Alfredo; D., DELLA SALA | |
| Codice identificativo SCOPUS: 2-s2.0-33947661928 | |
| Show it in Product Database (IRIS) |
